Ultratec ASAP-1 IPS

Since product launch, ASAP-1^® hardware has become the standard piece of preparation equipment that engineers involved in disciplines such as failure analysis, yield enhancement, radiation testing, and competitive analysis have come to rely on for backside preparation. ULTRA TEC has produced leading solutions for backside preparation since 1999. With over 250 ASAP-1 units installed in Semiconductor industry labs throughout the world, we are proud to introduce the ASAP-1^® IPS.

ENABLING THE NEXT GENERATION OF FAILURE ANALYSIS

Ever since the inception of the ASAP-1 Project, ULTRA TEC’s goal has been to offer both user-friendly and sample-friendly tools. The ASAP-1^® analog systems offer elegant, intuitive controls which have enabled all labs to achieve quality results for subsequent analysis with Photon emission microscopes, laser/ thermal stimulus microscopes and FIB’s. The user-friendly intutive nature of the analog units has been carried forward, and expanded with ASAP-1^® IPS.

DIGITAL CONTROL...DONE RIGHT!

ASAP-1^® IPS offers deep sub-micron control on X, Y and Z axes, making it 'hands-down' the most accurate system ever seen in the market.

 

 

IMPROVED SYSTEM CONTROLS

A dedicated machine-vision monitor provides a real time view of the part, overlaid with current system coordinates and parameter. Now you can see the part as it is being processed!
A touchscreen interface, a physical joystick and encoders -- alongside a suite of intuitive software and hardware -- empowers the FA technician & engineering professional for the next generation of failure analysis.