Semiconductor, Failure Analyst Systems & Equipments, Automatic Semicon Wafer Inspection - Radiant Optronics Pte Ltd

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Nikon Industrial Microscopes

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High Power Microscopes

L150

 

Eclipse 150, An upright digital microscope with modular solutions for industrial inspection.

 

 

 

L200N

 

Eclipse L200N, 200mm wafer and mask inspection microscope systems for reflected light defect identification.

 

 

 

L300N

 

Eclipse 300N, 300mm wafer and mask inspection microscope systems for reflected light defect identification.

 

 

LV-DAF Large

 

Eclipse-LV-DAF-Large, An upright microscope with dynamic auto-focus that brings fast, versatile focus to the Eclipse LV semiconductor inspection microscope series and OEM applications.

 

 

NWL200

 

 

 

NWL200, Advanced IC inspection wafer loader capable of loading 100µm thin wafers.

 

 

Optelics-H1200-Confocal_large

 

Optelics-H1200-Confocal_large, A new color confocal microscope featuring ultra-high image quality and resolution. Ideal for inspection and measurement of semiconductor, electronic parts, medical devices, and automotive materials.

 

MM400-800-Toolmakers-Microscopes_large

 

MM400-800-Toolmakers-Microscopes_large, High precision measuring microscopes featuring the latest in digital imaging technology.

 

 

Eclipse-MA200

 

Eclipse-MA200, A new inverted metallurgical microscope optimized for digital imaging and ergonomic efficiency.

 

 

Eclipse MA100

 

Eclipse MA100, A compact inverted metallurgical microscope designed for routine observation and analysis.

 

 

e-C1-Confocal

 

e-C1 Confocal, lHigh resolution confocal microscope system offering fluorescence images with unsurpassed resolution and contrast at an affordable price.

 

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